"X-ray thermal diffuse scattering as a texture-robust temperature diagnostic for dynamically compressed solids"
- Authors
P. G. HeighwayCorresponding Author, D. J. Peake , T. Stevens, J. S. Wark, B. Albertazzi; S. J. Ali, L. Antonelli, M. R. Armstrong, C. Baehtz, O. B. Ball, S. Banerjee, A. B. Belonoshko; C. A. Bolme, V. Bouffetier, R. Briggs, K. Buakor, T. Butcher, S. Di Dio Cafiso; V. Cerantola, J. Chantel, A. Di Cicco; A. L. Coleman, J. Collier , G. Collins, A. J. Comley, F. Coppari, T. E. Cowan, G. Cristoforetti, H. Cynn, A. Descamps, F. Dorchies, M. J. Duff; A. Dwivedi, C. Edwards; J. H. Eggert, D. Errandonea, G. Fiquet, E. Galtier, A. Laso Garcia, H. Ginestet, L. Gizzi, A. Gleason, S. Goede; J. M. Gonzalez, M. G. Gorman, M. Harmand, N. J. Hartley, C. Hernandez-Gomez, A. Higginbotham, H. Höppner, O. S. Humphries, R. J. Husband, T. M. Hutchinson, H. Hwang, D. A. Keen, J. Kim, P. Koester, Z. Konopkova, D. Kraus, A. Krygier, L. Labate, A. E. Lazicki, Y. Lee, H.-P. Liermann, P. Mason, M. Masruri, B. Massani, E. E. McBride, C. McGuire; J. D. McHardy, D. McGonegle, R. S. McWilliams, S. Merkel, G. Morard, B. Nagler, M. Nakatsutsumi, K. Nguyen-Cong, A.-M. Norton, I. I. Oleynik, C. Otzen, N. Ozaki, S. Pandolfi , A. Pelka, K. A. Pereira, J. P. Phillips, C. Prescher, T. Preston, L. Randolph, D. Ranjan, A. Ravasio, J. Rips, D. Santamaria-Perez, D. J. Savage, M. Schoelmerich, J.-P. Schwinkendorf , S. Singh, J. Smith, R. F. Smith, A. Sollier, J. Spear, C. Spindloe, M. Stevenson, C. Strohm, T.-A. Suer, M. Tang; M. Toncian, T. Toncian, S. J. Tracy; A. Trapananti, T. Tschentscher, M. Tyldesley, C. E. Vennari, T. Vinci, S. C. Vogel, T. J. Volz, J. Vorberger, J. T. Willman, L. Wollenweber, U. Zastrau, E. Brambrink, K. Appel, M. I. McMahon
- Journal
Journal of Applied Physics
Vol.138, Issue15, pp.155903, 2025.10 - DOI
Abstract
We present a model of x-ray thermal diffuse scattering (TDS) from a cubic polycrystal with an arbitrary crystallographic texture, based on the classic approach of Warren [B. E. Warren, Acta Crystallogr. 6, 803 (1953)]. We compare the predictions of our model with femtosecond x-ray diffraction patterns gathered from ambient and dynamically compressed rolled copper foils obtained at the High Energy Density instrument of the European X-Ray Free-Electron Laser facility and find that the texture-aware TDS model yields more accurate results than does the conventional powder model owed to Warren. Nevertheless, we further show: with sufficient angular detector coverage, the TDS signal is largely unchanged by sample orientation and in all cases strongly resembles the signal from a perfectly random powder; shot-to-shot fluctuations in the TDS signal resulting from grain-sampling statistics are at the percent level, in stark contrast to the fluctuations in the Bragg-peak intensities (which are over an order of magnitude greater); and TDS is largely unchanged even following texture evolution caused by compression-induced plastic deformation. We conclude that TDS is robust against texture variation, making it a flexible temperature diagnostic applicable just as well to off-the-shelf commercial foils as to ideal powders.
